000 00394nam a2200133Ia 4500
008 211209s2015 xx 000 0 und d
020 _a9788132233299
041 _aeng
082 _a621.395 BUS/ AGR
100 _aBUSHNELL, MICHAEL L
245 _aESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL MEMORY & MIXED SIGNAL VLSI CIRCUITS
260 _aNEW DELHI
_bSPRINGER
_c2015
300 _aXVIII, 690
999 _c91205
_d91205