000 00314nam a2200133Ia 4500
008 211209s2000 xx 000 0 und d
041 _aeng
082 _aBEN
100 _aBENTLEY, JOHN P
245 _aPRINCIPLES OF MEASUREMENT SYSTEMS
250 _a3 ed.
260 _aSINGAPORE
_bLONGMAN
_c2000
300 _a468
999 _c40597
_d40597