000 00313nam a2200121Ia 4500
008 211209s1980 xx 000 0 und d
041 _aeng
082 _a621.381 52 N80 GRI
100 _aGRIN G
245 _aSEMI CONDUCTOR DEVICES MEASUREMENT AND TESTS
260 _aMOSCOW
_bMIR PUBLISHERS
_c1980
300 _a207
999 _c17903
_d17903