Amazon cover image
Image from Amazon.com

DIGITAL INTEGRATED CIRCUITS: DESIGN-FOR-TEST USING SIMULINK AND STATEFLOW

By: Material type: TextTextLanguage: English Publication details: NEW YORK CRC PRESS PUB 2007Description: 320ISBN:
  • 9780849330575
DDC classification:
  • 621.3815 EVE
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Home library Call number Status Date due Barcode
Books M S Ramaiah Institute of Technology 621.3815 EVE (Browse shelf(Opens below)) Available 76160

There are no comments on this title.

to post a comment.